Inductively Coupled Plasma Mass Spectroscopy (ICP-MS)

ICP-MS is a supersensitive analyzer of inorganic elements and it mists high-temperature argon plasma with a sample and measures the mass of an ionized element. Its measured concentration ranges from ppb to ppt and it is equipped with the matrix and Octupole Reaction System (ORS) to denucleate polyatomic ion interference.

Inductively Coupled Plasma Analyzer of Emission Spectroscopy (ICP-AES)

ICP-AES is equipment that has mostly same excitation origin as ICP-MS, but it disperses the excitation light by a spectroscope and measures its spectrum. Wavelength of the light is particular to each elements and high sensitive analyze of its quality and quantity is possible because the strength o the light is proportional to the quantity of elements. Its dynamic range is a 4 to 5 digit and also it is able to analyze with other elements at same time.

Atomic Absorption Spectrophotometer (AAS)

Atomic Absorption Spectrophotometer is measuring equipment of inorganic elements which measures the absorbed amount by a specific characteristic that atomic vapor absorbs light of metal-specific wavelength. It utilizes Zeeman-effect background correction and also it is a tandem spectrometer that is able to complete both of frame analysis and graphite furnace analysis by just switching back and forth.

Glow Discharge Mass Spectrometry (GD-MS)

GD-MS is a supersensitive analyzer of multielement. An ionized element by Ar sputtering of grow discharge is analyzed by using a (double-focusing) mass spectrometry. Even conductive sample is available directly without putting it into solution; therefore there is no necessary preparation for this analysis. Additionally in-depth analyze of a sample is possible since it is measured with the sputtering.

Oxygen / Nitrogen Analyzer

Putting a sample into a graphite crucible in the helium stream and applying the high current heat it heated rapidly by its electric resistance and pylolyzed. During the pyrolysis, oxygen as CO and nitrogen as N2 are carried to each carrier gas. After this, an infrared sensing device measures CO and a thermal conductivity detector measures N2, and the determination quantity will be completed by converting each figure to its equivalent concentration.

Potentiometric Titrator

Potentiometric titration is one of volumetric analysis methods and finds the titration end-point by a titration curve reflecting the change of electric potential and the titer. Using auto buret, our equipment is able to achieve this automatically and we are using this method for the quantitative analysis of chlorine by using silver electrode.

Field Emission Scanning Electron Microscope (FE-SEM)

Scanning Electron Microscope is a type of electron microscope capable of producing high-resolution images of a sample surface by secondary electrons generated during a sample is irradiated by electron beam. Since this equipment is a field emission type and high-brightness can be obtained even with a very narrow electro beam, high resolution images are available compared with a multipurpose type (tungsten filament use). Furthermore, its accessory, an energy dispersive X-ray analyzer, makes it possible to realize the elemental mapping of microscopic region of the sample surface.

Laser Diffraction Particle Size Distribution Analyzer

Diffraction or scattering phenomenon occurs spatially and the light intensity distribution is appeared when a particle is irradiated by a laser beam, and it varies depending on the size of the irradiated particle. Particle size distribution can be obtained by the theoretical calculation utilizing combined patterns of all measured particles, Fraunhofer Diffraction Theory and Mie Scattering Theory. This method is highly reproducible and easy to operate as well as rapid measurement is available.

Powder X-ray Diffraction (XRD) Equipment

This equipment uses X-ray diffraction to provide information about powdered crystal or polycrystalline substances in a sample. By measuring an angle and an intensity of diffracted X-ray, material evaluation and analysis including qualitative or quantitative of a sample are possible.

Analysis		Price (yen)
Atomic absorption determination	One element in one sample Sample preparation for one sample	5,000~ 5,000~
ICP analysis	One element in one sample Sample preparation for one sample	5,000~ 5,000~
Fluorescent X-ray analysis	Chart only for one sample Analysis of one sample	15,000 15,000
X-ray diffraction qualitative analysis	Chart only for one sample Analysis of one sample	15,000 15,000
Scanning electron microscopy	Analysis of one sample	23,000
Grain size analysis	Analysis of one sample	15,000
Radioflex (X-ray transmission photography)	Analysis of one sample	10,000

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